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Dataray光束質量分析,光斑分析,M2光束分析系統

 

Dataray光束質量分析,光斑分析,M2光束分析系統

美國 DataRay 公司提供激光光束分析儀器,對激光光束的光斑大小,形狀和能量分布等參數進行全面的測試和分析;同時與個人電腦連接對分析的結果提供二維或三維的顯示,並對分析的結果進行打印輸出。適合各種各樣的激光光束,幫助你對你的激光光束的品質提供一個量化的結果。

產品分為︰
相機式光束質量分析儀(CCD式) Beam Profiling Cameras
狹縫掃描式光束質量分析儀 Slit Scan Beam Profilers

查看Dataray光束質量分析儀的選擇向導Dataray光束質量分析儀

相機式光束質量分析儀(CCD式)
Beam Profiling Cameras

WinCamD系列

WinCamD-UCD12
WinCamD-UCD12
WinCamD-UCD15
WinCamD-UCD15
WinCamD-UCD23
WinCamD-UCD23
WinCamD-UHR
WinCamD-UHR
WinCamD-XHR
WinCamD-XHR
WinCamD-FIR-HR
WinCamD-FIR-HR
WinCamD-LCM
WinCamD-LCM


BladeCam-HR和BladeCam-XHR系列

BladeCam-XHR
BladeCam-XHR
System-BladeCam-XHR
BladeCam-XHR-1310
BladeCam-XHR-1310
System-BladeCam-XHR-1310
BladeCam-XHR-UV
BladeCam-XHR-UV
System-BladeCam-XHR-UV
BladeCam-XHR
BladeCam-XHR
System-BladeCam-XHR
BladeCam-XHR-1310
BladeCam-XHR-1310
System-BladeCam-XHR-1310
BladeCam-XHR-UV
BladeCam-XHR-UV
System-BladeCam-XHR-UV


TaperCamD-UCD12和TaperCamD20-15-UCD23系列

TaperCamD-UCD12
TaperCamD-UCD12
System-TaperCamD-UCD12
TaperCamD-UCD12-1310
TaperCamD-UCD12-1310
System-TaperCamD-UCD12-1310
TaperCamD-UCD12-NIR
TaperCamD-UCD12-NIR
System-TaperCamD-UCD12-NIR
TaperCamD20-15-UCD23
TaperCamD20-15-UCD23
System-TaperCamD20-15-UCD23
TaperCamD20-15-UCD23-1310
TaperCamD20-15-UCD23-1310
System-TaperCamD20-15-UCD23-1310
TaperCamD20-15-UCD23-NIR
TaperCamD20-15-UCD23-NIR
System-TaperCamD20-15-UCD23-NIR


相機式光束質量分析儀附件

Filters/Samplers/Attenuators
Filters/Samplers/Attenuators
Lenses/Optics
Lenses/Optics
Translation Stages/Hardware
Translation Stages/Hardware
UV/IR Converters
UV/IR Converters
Replacement Detectors
Replacement Detectors
Replacement Cables
Replacement Cables
Manuals
Manuals

狹縫掃描式光束質量分析儀
Slit Scan Beam Profilers

Beam'R2系列

Beam'R2-Si
Beam'R2-S
System-BR2-Si
Beam'R2-InGaAs
Beam'R2-InGaAs
System-BR2-IGA
Beam'R2-DD Si/InGaAs (190-1750 nm)
Beam'R2-DD Si/InGaAs (190-1750 nm)
System-BR2-DD
Beam'R2-DD Si/InGaAs (190-2300 nm)
Beam'R2-DD Si/InGaAs (190-2300 nm)
System-BR2-DD-2300
Beam'R2-DD Si/InGaAs (190-2500 nm)
Beam'R2-DD Si/InGaAs (190-2500 nm)
System-BR2-DD-2500


BeamMap2 4XY/3XYKE系列

BeamMap2-4XY-Si
BeamMap2-4XY-Si
System-BMS2-4XY-Si
BeamMap2-4XY-InGaAs
BeamMap2-4XY-InGaAs
System-BMS2-4XY-IGA
BeamMap2-4XY-DD Si/InGaAs
BeamMap2-4XY-DD Si/InGaAs
System-BMS2-4XY-DD
BeamMap2-3XYKE-Si
BeamMap2-3XYKE-Si
System-BMS2-3XYKE-Si
BeamMap2-3XYKE-InGaAs
BeamMap2-3XYKE-InGaAs
System-BMS2-3XYKE-IGA
BeamMap2-3XYKE-DD Si/InGaAs
BeamMap2-3XYKE-DD Si/InGaAs
System-BMS2-3XYKE-DD


BeamMap2 ColliMate系列

BeamMap2-CM4-Si
BeamMap2-CM4-Si
System-BMS2-CM4-Si
BeamMap2-CM4-InGaAs
BeamMap2-CM4-InGaAs>
System-BMS2-CM4-IGA
BeamMap2-CM4-DD Si/InGaAs
BeamMap2-CM4-DD Si/InGaAs
System-BMS2-CM4-DD
BeamMap2-CM3-Si
BeamMap2-CM3-Si
System-BMS2-CM3-Si
BeamMap2-CM3-InGaAs
BeamMap2-CM3-InGaAs
System-BMS2-CM3-IGA
BeamMap2-CM3-DD Si/InGaAs
BeamMap2-CM3-DD Si/InGaAs
System-BMS2-CM3-DD


BeamScope-P8 系列

BeamScope-P8-Si
BeamScope-P8-Si
System-BSC-P8-Si
BeamScope-P8-Ge
BeamScope-P8-Ge
System-BSC-P8-Ge
BeamScope-P8-InAs
BeamScope-P8-InAs
System-BSC-P8-IA
BeamScope-P8-Si, extended probe head
BeamScope-P8-Si, extended probe head
System-BSC-P8-Si-EPH
BeamScope-P8-Ge, extended probe head
BeamScope-P8-Ge, extended probe head
System-BSC-P8-Ge-EPH
BeamScope-P8-InAs, extended probe head
BeamScope-P8-InAs, extended probe head
System-BSC-P8-IA-EPH


狹縫掃描式光束質量分析儀附件

Samplers/Attenuators
Samplers/Attenuators
Lenses/Optics
Lenses/Optics>
Translation Stages/Hardware
Translation Stages/Hardware
BeamScope Slits/Pinholes
BeamScope Slits/Pinholes
True2D Sapphire Slits
True2D Sapphire Slits
Replacement Cables
Replacement Cables
Manuals
Manuals

 


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